Bragg diffractors with graded-thickness multilayers
- 1 April 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 195 (1-2) , 63-65
- https://doi.org/10.1016/0029-554x(82)90758-3
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Layered Synthetic Microstructures as Dispersing Devices in X-ray SpectrometersApplied Spectroscopy, 1982
- Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performanceApplied Optics, 1981
- X-ray diffraction in multilayersOptics Communications, 1981
- X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron*Advances in X-ray Analysis, 1963