Oscillation in Semiconductors with a Dumbbell-Shaped Structure
- 1 June 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (6R)
- https://doi.org/10.1143/jjap.21.896
Abstract
A new model of current oscillation observed in the current saturation regime of the current-voltage characteristic in semiconductors with a dumbbell-shaped structure is proposed. As the electron and hole drift velocities deviate from Ohm's law, an electric double layer is formed on the anode side of the narrow region of a sample and a negative resistance region appears on the cathode side. These formations in the sample cause the current oscillation. Experimental measurements of the potential distributions in the sample are carried out for n-type germanium and it is shown that these results can be explained well by the proposed model.Keywords
This publication has 5 references indexed in Scilit:
- A Simplified Current Oscillation Model in the SOGICON DeviceJapanese Journal of Applied Physics, 1979
- The Electric Field Enhancement (EFE) Effect in SogiconJapanese Journal of Applied Physics, 1964
- Observations of Instability in Semiconductors caused by Heavily Injected Minority CarriersJournal of the Physics Society Japan, 1962
- The “Sogicon” –A New Type of Semiconductor OscillatorJournal of the Physics Society Japan, 1962
- A Reversed Carrier Transport Effect in GermaniumProceedings of the Physical Society, 1960