Multiple fault simulation in linear active circuits

2 September 1976

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 12 (18) , 467-468
https://doi.org/10.1049/el:19760355

Abstract

An efficient algorithm is described for simulating the effects of multiple faults in linear active circuits. The process is also applicable to the multiparameter large-change sensitivity analysis of linear circuits. It is based on a generalisation of the branch-at-a-time circuit-analysis algorithm of Kron and Branin.

Keywords

LINEAR ACTIVE CIRCUITS
MULTIPARAMETER LARGE CHANGE SENSITIVITY ANALYSIS
MULTIPLE FAULT SIMULATION
BRANCH AT A TIME CIRCUIT ANALYSIS

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