Analysis of Bloch-wall fine structures by magnetic force microscopy

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Abstract
Microfield profiles of isolated 180° Bloch walls in highly perfect iron single crystals have been detected using a magnetic force microscope (MFM). The achieved spatial resolution of 10 nm permits a first quantitative insight into the near-surface variation of the stray field. A closer analysis of the experimental data by comparison with model calculations confirms some fundamental uncertainties in image interpretation generally inherent to the MFM technique. The basic problems are summarized as a general guideline for the applicability of the MFM technique.