Test chip based approach to automated diagnosis of CMOS yield problems
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 3 (1) , 18-27
- https://doi.org/10.1109/66.47972
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Statistical Significance Of Defect density EstimatesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Evolution and Accomplishments of VLSI Yield Management at IBMIBM Journal of Research and Development, 1982