Influence of the charge pumping effect on an integrated solid-state image sensor using MOST switches

1 April 1973

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 61 (4) , 491-492
https://doi.org/10.1109/PROC.1973.9085

Abstract

The charge pumping in image sensors with MOST switches is simulated experimentally and discussed. It is found that photodiode potential is changed with no illumination, that photoelectric characteristics are degraded, and that a storage mode operation cannot be achieved. A desirable treatment available to diminish this effect is proposed.

Keywords

CHARGE PUMPS
SOLID STATE CIRCUITS
IMAGE SENSORS
SWITCHES
INTEGRAL EQUATIONS
SYSTEM TESTING
PHOTODIODES
IMAGE STORAGE
DIFFERENTIAL EQUATIONS
FREQUENCY