Angular momentum branching ratios for electron-induced ionization: Atomic and model calculations
- 15 December 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (17) , 9011-9024
- https://doi.org/10.1103/physrevb.36.9011
Abstract
We present calculations of the matrix elements for electron-induced ionization of core electrons of atoms. We use both self-consistent atomic potentials for accuracy and model potentials to gain physical insight. We pay particular attention to the angular momentum distribution of the two final-state electrons, especially when one of them lies near what would be the Fermi energy in a solid (i.e., as in an absorption fine-structure experiment). For nodeless core wave functions, in the dominant channel both final-state electrons have angular momentum one greater than that of the initial core state. For sufficiently deeply bound states, this first approximate selection rule holds until the incident electron energy exceeds the ionization threshold by at least 500 eV, i.e., over the experimentally relevant range. It is also possible to determine the angular momentum distribution of the final-state electron. The EXAFS-like electron tends to have angular momentum one greater than that of the initial core state, even in some cases where the first approximate selection rule does not hold. (EXAFS is extended x-ray-absorption fine structure.) The strongest trend is that the dipole component in a partial-wave expansion of the Coulomb interaction dominates the matrix element. In these studies, careful treatment of not just the core state but also the unbound states is crucial; we show that the conventional orthogonalized plane-wave approximation is inadequate, giving incorrect ordering of the channels. For model potentials with an adjustable screening length, low-lying bound resonances are found to play an important role.Keywords
This publication has 45 references indexed in Scilit:
- Threshold Law for Electron-Atom Impact IonizationPhysical Review Letters, 1982
- Extended absorption fine structure analysis of surface structureApplications of Surface Science, 1982
- Electronic structure of molecules by (e,2e) spectroscopyAccounts of Chemical Research, 1982
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981
- Electron-impact ionization cross sections for highly ionized hydrogen- and lithium-like atomsPhysical Review A, 1980
- Extended Appearance-Potential Fine-Structure Analysis: Oxygen on Al(100)Physical Review Letters, 1980
- The use of Fourier transforms for analyzing the extended fine structure above appearance potential thresholdsSurface Science, 1979
- Extended fine structure above vanadium L-shell appearance potential thresholdsApplications of Surface Science, 1978
- (e, 2e) spectroscopyPhysics Reports, 1976
- Photo-Ionization in the Soft x-Ray Range: 1Dependence in a Central-Potential ModelPhysical Review B, 1968