In-Situ Characterization of Thin Polycrystalline Diamond Film Quality by Thermal Wave and Raman Techniques
- 1 January 1989
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Characterization of diamond films by Raman spectroscopyJournal of Materials Research, 1989
- MIRAGE DETECTION OF THERMAL WAVESPublished by Elsevier ,1989