Determination of the rare-earth∶Nb mass ratio in doped LiNbO3 by the TXRF technique
- 16 July 2001
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Journal of Analytical Atomic Spectrometry
- Vol. 16 (8) , 867-869
- https://doi.org/10.1039/b102880b
Abstract
This paper describes a new method for evaluating the mass contents of rare-earth elements used as dopants in LiNbO3 single crystals with respect to Nb. The method is based on the technique of total-reflection X-ray fluorescence (TXRF). The method presented does not require chemical manipulation of the samples and is rapid (30 min sample preparation and 10 min analysis), precise (between 2 and 8% of variation coefficient) and simple.Keywords
This publication has 8 references indexed in Scilit:
- Wavelength dependence of electro-optic coefficientsin congruent and quasi-stoichiometric LiNbO 3Electronics Letters, 1999
- Bulk periodically poled lithium niobate doped with Yb3+ ions: Growth and characterizationApplied Physics Letters, 1999
- Growth and second harmonic generation characterization of Er3+ doped bulk periodically poled LiNbO3Applied Physics Letters, 1998
- Analysis of Archaeological Ceramics by TXRF and Contrasted with NAAJournal of Archaeological Science, 1997
- Optical spectroscopy ofions inPhysical Review B, 1995
- The role of total-reflection X-ray fluorescence in atomic spectroscopySpectrochimica Acta Part B: Atomic Spectroscopy, 1993
- Total reflection X-ray spectrometry: method and applicationsSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Extension of the analytical range of total reflection X-ray fluorescence spectrometry to lighter elements (11 ⩽ Z < 16) and increase in sensitivity by excitation with tungsten Lα radiationSpectrochimica Acta Part B: Atomic Spectroscopy, 1989