Simultaneous Measurement of Channeling Effects on the Sputtering and Backscattering Processes

Sputtering and backscattering yields have been simultaneously measured for beams of H, He, and N incident on a single Au crystal near the axes. The angular half-width ${\psi }_{\frac{1}{2}}$ of the yield minima produced by crystal rotation were measured and compared with the low-energy critical-angle predictions of Lindhard. Dechanneling effects were observed to play a major role in determining the magnitude and energy dependence of the observed minima.