16-term error model and calibration procedure for on wafer network analysis measurements (MMICs)
- 9 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1125-1127
- https://doi.org/10.1109/mwsym.1991.147214
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer CalibrationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988
- A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage ErrorsIEEE Transactions on Microwave Theory and Techniques, 1977