Semiconductor laser lineshape and parameter determination from fringe visibility measurements
- 27 September 1984
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 20 (20) , 826-828
- https://doi.org/10.1049/el:19840562
Abstract
The field autocorrelation function of single-mode 1.3 μm InGaAsP lasers has been measured using a Michelson interferometer. Comparison with theory for semiconductor laser line broadening yields the relaxation oscillation frequency, its damping rate and the linewidth broadening factor. A comparison with other techniques for lineshape measurement is presented.Keywords
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