Mechanism of Biaxial Alignment of Oxide Thin Films during Ion‐Beam‐Assisted Deposition
- 1 October 1997
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 80 (10) , 2637-2648
- https://doi.org/10.1111/j.1151-2916.1997.tb03166.x
Abstract
No abstract availableKeywords
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