In environmental Scanning Electron Microscopy, the secondary electron signal reveals surface information not accessible by conventional backscattered electron signals
- 6 August 1989
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 47, 78-79
- https://doi.org/10.1017/s0424820100152367
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- A gaseous detector device for an environmental SEMMicron and Microscopica Acta, 1983