Structural characterization of thin ZnS films by X-ray diffraction
- 1 April 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 90 (3) , 339-343
- https://doi.org/10.1016/0040-6090(82)90392-3
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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