Representation and interpretation of overlapped line segments for automatic recognition of lsi cell drawings

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Abstract
One of the important items in the automatic recognition of LSI cell drawings is the representation and interpretation of the overlapped part (overlap portion) composed of more than one line, different colors, or solid and dashed lines. This paper discussed first the representation of the overlap portion, and proposes a new representation method which has less ambiguity in the automatic interpretation of the overlap portion and makes the drawing easy for the designer. The algorithm is proposed which automatically interprets the overlap portion by this representation. The algorithm is composed of three parts: recognition of overlap symbol, search of the boundary of the overlap portion, and estimation of the overlapped paths. In particular, the estimation of the overlapped paths includes the rule‐type description for the major part and a heuristic method, which estimates the paths by adaptively enlarging the range of search. A program based on the proposed algorithm is combined into the cell‐drawing input device. The result of recognition for an actual cell drawing is presented.

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