Image Steganalysis Based on Moments of Characteristic Functions Using Wavelet Decomposition, Prediction-Error Image, and Neural Network
- 24 October 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In this paper, a general blind steganalysis system is proposed, in which the statistical moments of characteristic functions of the prediction-error image, the test image, and their wavelet subbands are selected as features. Artificial neural network is utilized as the classifier. The performance of the proposed steganalysis system is significantly superior to the prior arts.Keywords
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