High-resolution analysis of exponentially decaying transients for physics d.l.t.s. experiments

25 October 1979

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 15 (22) , 724-725
https://doi.org/10.1049/el:19790515

Abstract

A class of analysing functions is proposed to improve the resolution of the measurement of exponential transients in d.l.t.s. experiments. These functions offer a trade-off between resolution and sensitivity to noise as measured by a signal/noise ratio. Implementation may be by either analogue or digital (point sampling) correlation.

Keywords

RESOLUTION ANALYSIS
SIGNAL/NOISE RATIO
EXPONENTIALLY DECAYING TRANSIENTS
DIGITAL CORRELATION
ANALYSING FUNCTIONS
ANALOGUE CORRELATION
SEMICONDUCTOR
DEEP LEVEL TRANSIENT SPECTROSCOPY EXPERIMENTS
DLTS EXPERIMENTS

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