Field ion microscope examination of heavy ion radiation damage in iridium II. analysis of vacancy distributions

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Abstract
Two methods are described for determining the distribution of point defects in field ion microscope specimens from a series of micrographs. Both methods assume the micrographs to be orthographic projections of the specimen surface; the first is a manual method and the second uses a digitizer and computer. Examples are given of vacancy distributions in specimens bombarded with heavy ions at (a) 78°k and (b) room temperature.