Hexafluorosilicic Acid Reagent Modification for Quartz Isolation
- 1 November 1976
- journal article
- Published by Wiley in Soil Science Society of America Journal
- Vol. 40 (6) , 958-960
- https://doi.org/10.2136/sssaj1976.03615995004000060040x
Abstract
Up to three sequential 3‐day treatments with commercial H2SiF6 were required to remove feldspar XRD peaks from many samples of loess and glacial till. Two such repeated treatments lowered the yield of isolated quartz by about 10%. For example, with Memphis C horizon loess from Yalobusha Co., Miss., the yield dropped from 29 to 19% of the 1–10 µm size fraction. Pretreatment of the H2SiF6 with finely ground quartz (1–100 µm size fraction) raised the quartz yield after one or two 3‐day treatments about 10%, for example from 29 to 39% of the initial 1–10 µm fraction of Yalobusha loess. After a third 3‐day treatment the yield was 32%. The quartz of this loess was of 100% purity after one 3‐day H2SiF6 treatment, as established by XRD and XRS. The oxygen isotope delta value was affected a little, the δ18O declining from 17 to 16‰ for the 1–10 µm quartz isolates treated one to three times with H2 SiF6, and fine quartz particles were released (SEM) from clusters in fine chert contained in the loess.Funding Information
- National Science Foundation (GA‐36219, GA‐22711)
This publication has 0 references indexed in Scilit: