Universal statistics of transport in disordered conductors

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Abstract
We study electron counting statistics of a disordered conductor in the low-temperature limit. We derive an expression for the distribution of charge transmitted over a finite time interval by using a result from the random-matrix theory. In the metallic regime, the peak of the distribution is Gaussian and shows negligible sample-to-sample variations. On the contrary, the tails of the distribution are neither Gaussian nor Poisson-like and exhibit strong sample-to-sample variations.