Correction for escape in X-ray spectra measured using a Ge detector

1 December 1983

journal article
Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography

Vol. 16 (6) , 641-644
https://doi.org/10.1107/s0021889883011218

Abstract

X-ray spectra measured with a germanium detector can be corrected for escape. A numerical procedure to perform the correction has been implemented. The method employs a point by point subtraction and allows for energy-dependent detector resolution.

Keywords

SPECTRA MEASURED
GERMANIUM DETECTOR
X RAY SPECTRA
NUMERICAL PROCEDURE
POINT SUBTRACTION
DETECTOR RESOLUTION
DEPENDENT DETECTOR
ENERGY DEPENDENT

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