The Importance of Grain Boundaries for the Time-Dependent Mobility Degradation in Organic Thin-Film Transistors
- 28 September 2009
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 21 (20) , 4949-4954
- https://doi.org/10.1021/cm902145x
Abstract
No abstract availableKeywords
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