The measurement of defect parameters in imperfect crystals using X-ray diffraction

• 1 September 1993
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
• Vol. 49  (5) , 755-762
• https://doi.org/10.1107/s0108767393003411

Abstract

Keywords

• STOCHASTIC MODEL
• EXTRACTING THE PARAMETERS
• CDTE
• DIFFRACTION
• IMPERFECT CRYSTALS
• GAAS
• ROCKING CURVES
• DEFECT