Auger-Electron Spectroscopy as a Local Probe of Atomic Charge: Si
- 20 March 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 40 (12) , 807-809
- https://doi.org/10.1103/physrevlett.40.807
Abstract
Auger-electron spectroscopy is shown to measure something quite different from photoemission: the distribution of atomic (as opposed to overlap) charge populations across the valence bands. While matrix-element effects must be considered in band materials, their inclusion in calculations still lead to poor agreement with experiment. Good agreement may be obtained, however, if one divides the electronic charge into atomic and overlap (bonding) LCAO components and notes that the latter does not contribute to the Auger current.
Keywords
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