Improved technique for determining complex permittivity with the transmission/reflection method
Open Access
- 1 August 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 38 (8) , 1096-1103
- https://doi.org/10.1109/22.57336
Abstract
The transmission/reflection method for complex permittivity and permeability determination is studied. The special case of permittivity measurement is examined in detail. Robust algorithms for permittivity determination that eliminate the ill-behaved nature of the commonly used procedures at frequencies corresponding to integer multiples of one-half wavelength in the sample are presented. An error analysis yielding estimates of the errors incurred due to the uncertainty in scattering parameters, length measurement, and reference plane position is presented. Equations for determining complex permittivity independent from reference plane position and sample length are derived.Keywords
This publication has 10 references indexed in Scilit:
- Reflection coefficient of a waveguide with slightly uneven wallsIEEE Transactions on Microwave Theory and Techniques, 1989
- A Fast Computational Technique for Accurate Permittivity Determination Using Transmission Line MethodsIEEE Transactions on Microwave Theory and Techniques, 1983
- An automated frequency domain technique for dielectric spectroscopy of materialsJournal of Physics E: Scientific Instruments, 1979
- On the use of windows for harmonic analysis with the discrete Fourier transformProceedings of the IEEE, 1978
- A Combined Total Reflection-Transmission Method in Application to Dielectric SpectroscopyIEEE Transactions on Instrumentation and Measurement, 1978
- Automatic measurement of complex dielectric constant and permeability at microwave frequenciesProceedings of the IEEE, 1974
- Measurement of the Intrinsic Properties of Materials by Time-Domain TechniquesIEEE Transactions on Instrumentation and Measurement, 1970
- Measurement of RF properties of materials a surveyProceedings of the IEEE, 1967
- Measurement and Standardization of Dielectric SamplesIRE Transactions on Instrumentation, 1962
- Determination of Reflection Coefficients and Insertion Loss of a Wave-Guide JunctionJournal of Applied Physics, 1953