Rapid, pulse counting low-energy electron diffraction instrument

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Abstract
A low‐energy electron diffraction instrument has been constructed which allows one to visually observe a LEED pattern, record the pattern photographically and obtain immediate, quantitative intensity data from several diffraction beams in 5–10 s. The instrument operates at incident beam currents of a few picoamperes eliminating electron beam damage effects. This paper describes the design and construction of this new LEED instrument and reports on the operating parameters of sensitivity, signal‐to‐noise, image distortion, and angular resolution.