Detection of thin surface films by electron beam microanalysis. A comparison between wavelength-dispersive and energy-dispersive microprobes
- 16 July 1976
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 36 (1) , 253-261
- https://doi.org/10.1002/pssa.2210360127
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Backscattering of 10-100 keV electrons from thick targetsJournal of Physics D: Applied Physics, 1975
- X-ray continuum from thick elemental targets for 10–50-keV electronsJournal of Applied Physics, 1974
- Sub-monolayer detection by electron microprobe analysisJournal of Physics D: Applied Physics, 1973
- The determination of thin layer thicknesses with an electron microprobeSurface Science, 1973
- Electron probe microanalysisSurface Science, 1971
- Use of electron microprobe analysis to determine layer thicknesses down to the monolayer rangePhysica Status Solidi (a), 1970
- The ionization of hydrogen and of hydrogenic positive ions by electron impactProceedings of the Physical Society, 1966
- Classical Theory of Atomic Collisions. I. Theory of Inelastic CollisionsPhysical Review B, 1965
- Zur Theorie des Durchgangs schneller Korpuskularstrahlen durch MaterieAnnalen der Physik, 1930
- XCIII. On the theory of X-ray absorption and of the continuous X-ray spectrumJournal of Computers in Education, 1923