Electron microscopic and AES studies on thin layers of NiCr
- 1 January 1983
- Vol. 33 (1-2) , 111-115
- https://doi.org/10.1016/0042-207x(83)90541-9
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Backscattering spectra of medium energy electronsActa Physica Academiae Scientiarum Hungaricae, 1980
- Effect of trimming on the structure of NiCr thin filmsActa Physica Academiae Scientiarum Hungaricae, 1980
- Matrix effects in quantitative auger analysis of dilute alloysSurface Science, 1979
- Resistance stabilization of Ni–Cr films by surface oxide formationJournal of Vacuum Science and Technology, 1979
- Some aspects of auger electron spectra of 3d transition metal oxidesApplied Physics A, 1977
- The oxidation of alloysReports on Progress in Physics, 1976
- Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical ProfilesJournal of Vacuum Science and Technology, 1972
- The production, properties and uses of thin films condensed in vacuoVacuum, 1951