On the recombination of electrons and holes at traps with finite relaxation time
- 31 August 1981
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 24 (8) , 749-752
- https://doi.org/10.1016/0038-1101(81)90056-3
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Trap saturation in silicon solar cellsApplied Physics Letters, 1975
- Cascade Capture of Electrons in SolidsPhysical Review B, 1960
- Thermal Generation of Recombination Centers in SiliconPhysical Review B, 1957
- Statistics of the Charge Distribution for a Localized Flaw in a SemiconductorPhysical Review B, 1957
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952
- Electron-Hole Recombination in GermaniumPhysical Review B, 1952