The X-ray characterization of the ultrafine-grained Cu processed by different methods of severe plastic deformation
- 30 August 1997
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 234-236, 331-334
- https://doi.org/10.1016/s0921-5093(97)00135-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Structural characterization of nanocrystalline copper by means of x-ray diffractionJournal of Applied Physics, 1996
- Approach to nanostructured solids through the studies of submicron grained polycrystalsNanostructured Materials, 1995
- Structure and properties of ultrafine-grained materials produced by severe plastic deformationMaterials Science and Engineering: A, 1993
- Profile Analysis for Microcrystalline Properties by the Fourier and Other MethodsAustralian Journal of Physics, 1988