SEM Analysis of Ionizing Radiation Effects in an Analog to Digital Converter (AD571)
- 1 January 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 28 (6) , 4051-4055
- https://doi.org/10.1109/TNS.1981.4335673
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- SEM Analysis of Ionizing Radiation Effects in Linear Integrated CircuitsIEEE Transactions on Nuclear Science, 1977
- Sem irradiation for hardness assurance screening and process definitionIEEE Transactions on Nuclear Science, 1974