1 THz-bandwidth proper for high-speed devices and integrated circuits

19 November 1987

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 23 (24) , 1308-1310
https://doi.org/10.1049/el:19870905

Abstract

We describe an external electro-optic technique for characterising high-speed electrical signals in two-dimensional electrode structures of devices and integrated circuits fabricated on any substrate material. A temporal resolution of less than 300 fs, corresponding to a bandwidth in excess of 1 THz has been achieved.

Keywords

300 FS
HIGH-SPEED ELECTRICAL SIGNALS
INTEGRATED CIRCUITS
PROBER
TWO-DIMENSIONAL ELECTRODE STRUCTURES
EXTERNAL ELECTRO-OPTIC TECHNIQUE
DIGITAL IC TESTING
HIGH-SPEED DEVICES
TEMPORAL RESOLUTION
1 THZ

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