Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation
- 13 February 1998
- journal article
- Published by Elsevier in Chemical Physics Letters
- Vol. 283 (5-6) , 368-372
- https://doi.org/10.1016/s0009-2614(97)01378-x
Abstract
No abstract availableKeywords
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