Testing Embedded Memories: Is BIST The Ultimate Solution?

• 25 August 2005
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 516-517
• https://doi.org/10.1109/ats.1998.741668

Abstract

Keywords

• BUILT-IN SELF-TEST
• LOGIC TESTING
• RANDOM ACCESS MEMORY
• LOGIC DEVICES
• AUTOMATIC TESTING
• SYSTEM TESTING
• REDUNDANCY
• APPLICATION SPECIFIC INTEGRATED CIRCUITS
• SEMICONDUCTOR MEMORY
• SEMICONDUCTOR DEVICE NOISE