A Technique for the Preparation of Thin-Film Cross-Sections for Transmission Electron Microscopy
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Dependence of magnetics, microstructures and recording properties on underlayer thickness in CoNiCr/Cr mediaIEEE Transactions on Magnetics, 1988
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984