Atmospheric-Pressure Helium Inductively Coupled Plasmas for Elemental Mass Spectrometry
- 1 April 1996
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 50 (4) , 427-435
- https://doi.org/10.1366/0003702963906140
Abstract
Analytical and fundamental characteristics of helium inductively coupled plasma mass spectrometry (He ICPMS) were explored for atmospheric-pressure plasmas generated in a 13-mm He ICP torch with the use of a prototype ICPMS equipped with an analogue detector. Four sets of operating conditions were identified for the detection of four categories of elements at levels lower than or similar to those of the Ar ICPMS. In general, detection limits of He ICPMS were improved by two to four orders of magnitude for metals, compared to results from our previous study with the same torch. For the easy-to-atomize elements (Li, Na, K, Ga, Rb, In, Cs, Tl, Pb, and Bi), the detection limits ranged from 0.1 to 7 pg/mL at 500–600 W forward power. Detection limits of the fourth-period transition metals (Cr, Mn, Fe, Co, Ni, and Cu), i.e., elements subject to the spectral interferences in Ar ICPMS, were 4 to 100 pg/mL at a power level of 560–700 W. The detection limits of hard-to-atomize elements (Ti, V, Sr, Y, Rh, Pr, Tm, Th) ranged from 4 to 90 pg/mL at 800 W. For hard-to-ionize elements (As, Se, Br, Sn Sb, I), detection limits of 0.05 to 1 ng/mL were obtained at 820 W. Ion kinetic energies were measured under two diverse sets of operating conditions. At 600 W, the ion kinetic energies were very low (2.6–6.6 eV for mass range 39–209 amu), indicating the absence of a secondary discharge at the sampler tip of the MS interface. The gas-kinetic temperature estimated in this measurement was 600 K for the 600-W He ICP. In contrast, very high ion kinetic energies (31–66 eV for mass range 51–232 amu) were obtained at 800 W. The estimated plasma potential and gas kinetic temperature were 22 V and 3500 K, respectively. Ion kinetic energies of polyatomic ions were slightly lower than those of atomic ions at the same mass, suggesting that polyatomic ions were formed in the low-temperature zones of the He ICP.Keywords
This publication has 42 references indexed in Scilit:
- Elemental mass spectrometry using a nitrogen microwave-induced plasma as an ion sourceSpectrochimica Acta Part B: Atomic Spectroscopy, 1994
- Elemental mass spectrometry using a helium microwave plasma torch as an ion sourceSpectrochimica Acta Part B: Atomic Spectroscopy, 1994
- The helium microwave-induced plasma: an alternative ion source for plasma mass spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1994
- Trace analysis in high matrix aqueous solutions using helium microwave induced plasma mass spectrometryJournal of Analytical Atomic Spectrometry, 1994
- Characterization of polyatomic ion interferences in inductively coupled plasma mass spectrometry using a high resolution mass spectrometerJournal of Analytical Atomic Spectrometry, 1994
- Helium microwave induced plasma mass spectrometry for detection of metals and nonmetals in aqueous solutionsSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- High Resolution Mass Spectrometry with Inductively Coupled Argon Plasma Ionization SourceAnalytical Sciences, 1989
- Communication. Inductively coupled plasma as an ion source for high-resolution mass spectrometryJournal of Analytical Atomic Spectrometry, 1989
- Application of helium microwave-induced plasma mass spectrometry to the detection of high ionisation potential gas phase speciesJournal of Analytical Atomic Spectrometry, 1988
- Detection of halogens as positive ions using a He microwave induced plasma as an ion source for mass spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1987