A temperature fixed point device incorporating samples of the elements Cd, Zn, Al, In and Pb has been available from the NBS for several years. This paper describes current efforts to reduce the temperature uncertainties of the NBS device below the present one milli-kelvin level. It also notes that efforts to produce narrow transition widths in samples of Nb, V3Ga and Nb3Sn have resulted in widths of 9 mK, 40 mK and 17 mK, respectively