Structural characterization of Sol-Gel derived planar waveguides by very low frequency Raman spectroscopy
- 1 September 1992
- journal article
- Published by IOP Publishing in Journal of Optics
- Vol. 23 (5) , 215-222
- https://doi.org/10.1088/0150-536x/23/5/004
Abstract
The sol-gel method has been used to prepare three different planar waveguides of low attenuation. The aim of the paper is to show that very low frequency waveguide Raman spectroscopy is useful for the characterization of the thin film.Keywords
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