Lifetimes of some levels belonging to the4p55pand4p56pconfigurations of Kri

Abstract
The lifetimes of sixteen levels of Kri belonging to the 4p55p and 4p56p configurations have been measured by the delayed-coincidence method. The results are compared with other experimental values and with theoretical calculations using jK coupling and using intermediate coupling. From cascade components, lifetime values for some levels belonging to the 4p54d configuration can be inferred.

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