The effect of ionizing radiation on sol-gel ferroelectric PZT capacitors
- 1 December 1990
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (6) , 1713-1717
- https://doi.org/10.1109/23.101181
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Total-dose radiation-induced degradation of thin film ferroelectric capacitorsIEEE Transactions on Nuclear Science, 1990
- Ferroelectric MemoriesScience, 1989
- Radiation effects on ferroelectric thin-film memories: Retention failure mechanismsJournal of Applied Physics, 1989
- Thin-film ferroelectrics of PZT of sol-gel processingIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 1988
- Rochelle Salt as a DielectricPhysical Review B, 1930