Synergy of line profile analysis and selected area topography by the X-ray divergent beam method
- 1 November 1969
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 2 (5) , 200-209
- https://doi.org/10.1107/s0021889869006984
Abstract
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