Latent B-Radiation Damage in Hermetically Sealed NMOS Devices

• 1 April 1981
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• p. 34-37
• https://doi.org/10.1109/irps.1981.362969

Abstract

Keywords

• GAMMA RAYS
• FAILURE ANALYSIS
• VERY LARGE SCALE INTEGRATION
• PACKAGING
• RADIATION DETECTORS
• TESTING