Response to the critique to the paper ‘‘The role of shallow traps on the mobility of electrons in liquid Ar, Kr, and Xe’’
- 1 March 1981
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 74 (5) , 3082-3084
- https://doi.org/10.1063/1.441401
Abstract
In response to the critique of the previous papers by Freeman and some of the comments by Schnidt et al., it is shown that the electric field dependence of the drift velocity is inconsistent with the hot electron model. The information obtained from the addition of polyatomic impurities to the liquified rare gases is inconsistent with a picture of an average electron energy that is a large fraction of 1 eV. In the following paper it will be shown that the field dependence of the trapping rate constant of electrons with SF6 and O2 can be quantitatively explained with no reference to hot electrons. (AIP)Keywords
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