On the design of easily testable sequential machines

1 October 1971

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/swat.1971.22

Abstract

In order to obtain a short fault-detection sequence for a sequential machine, the concept of an easily testable machine is introduced. Such a machine is one which possesses a minimal-length homogeneous distinguishing sequence and requires no transfer sequences in the fault-detection sequence. A design procedure is presented in which an arbitrary machine is embedded in an easily testable machine by adding input lines to the original machine. The procedure also derives a fault-detection sequence for the easily testable machine.

Keywords

This publication has 6 references indexed in Scilit:

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IEEE Transactions on Computers, 1971
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IEEE Transactions on Computers, 1970
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IEEE Transactions on Computers, 1970
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Published by Institute of Electrical and Electronics Engineers (IEEE) ,1964