Comparative Study of Trapping Parameters of LiF (TLD-100) from Different Production Batches

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Abstract
Computerised glow curve analysis has been used to determine the trapping parameters of the main peaks of the thermoluminescent (TL) material LiF(TLD-100). The TL material (solid state chips) originated from six different production batches with at least 19 chips per batch. The maxima of glow peaks 2 to 5 are found at the same temperature within very small limits. The activation energy and frequency factor of the main glow peak (peak 5) of TLD-100 originating from two batches differ significantly from those of the other four investigated batches. Nevertheless, the sensitivity of glow peak 5 is more or less the same for all batches. The trapping parameters of glow peaks 2 to 4 of TLD-100 vary little from batch to batch. The measured half-life of peak 2 differed strongly from batch to batch. For all investigated peaks no correlation has been found between glow peak sensitivity and trapping parameters. The results of this study suggest that both defect concentration and nature of the trapping centres vary from batch to batch. It would appear that as a consequence of selection by the manufacturer, the differences between the batches in terms of total light output are small.

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