Demountable polished extra-thin sections and their use in transmission electron microscopy
- 1 September 1981
- journal article
- Published by Mineralogical Society in Mineralogical Magazine
- Vol. 44 (335) , 357-359
- https://doi.org/10.1180/minmag.1981.044.335.19
Abstract
The advantages of polished ultra-thin sections (PUTS) in the study of very fine-grained materials, such as occur in some meteorites, have been illustrated by Fredriksson et al. (1978) whose technique is based on the earlier work of Beauchamp and WiUiford (1974). An essential feature of such methods for friable and heterogeneous materials is the use of a medium, usually an epoxy resin, to consolidate and partially impregnate them. Normally one polished side of the specimen is bonded to a glass slide during preparation, and the finished PUTS are integral with the slide on completion. PUTS are typically 2-5 microns in thickness.Keywords
This publication has 2 references indexed in Scilit:
- Transmission Electron Microscopy in Earth ScienceAnnual Review of Earth and Planetary Sciences, 1977
- Thin foils of non-metals made for electron microscopy by sputter-etchingJournal of Materials Science, 1970