X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers
- 15 December 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 52 (24) , R17052-R17055
- https://doi.org/10.1103/physrevb.52.r17052
Abstract
The nature of the interfacial roughness in /Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from ∼25 to 100 Å.
Keywords
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