DETERMINATION OF CHARACTERS FOR YIELD SELECTION IN SPRING WHEAT
- 1 October 1973
- journal article
- Published by Canadian Science Publishing in Canadian Journal of Plant Science
- Vol. 53 (4) , 755-762
- https://doi.org/10.4141/cjps73-146
Abstract
A 2-yr study of 22 cultivars of spring wheat (Triticum aestivum L.) showed that yield per ear and number of ears per plant reduced yield variance the most in stepwise regression analysis. These two components of yield were negatively correlated. Harvest index, kernels per ear, and yield per ear were associated with plot yield. Kernels per ear and kernel weight were associated with yield per ear. Morphological characters influenced plot yield indirectly in that ear area, flag leaf width, and total photosynthetic area above the flag leaf node were associated with yield per ear. Ears per plant, yield per ear, and harvest index considered together in a selection program should be an effective means of selecting for increased yield.Keywords
This publication has 7 references indexed in Scilit:
- Single-plant characters as a measure of field plot performance of wheat cultivarsAustralian Journal of Agricultural Research, 1972
- Relationships Between Yield and Its Components and Structures Above the Flag Leaf Node in Spring Wheat1Crop Science, 1971
- INHERITANCE OF MORPHOLOGICAL CHARACTERS ASSOCIATED WITH YIELD IN SPRING WHEATCanadian Journal of Plant Science, 1969
- The breeding of crop ideotypesEuphytica, 1968
- The relationship of grain yield to vegetative growth and post-flowering leaf area in the wheat crop under conditions of limited soil moistureAustralian Journal of Agricultural Research, 1966
- Polarization in Case of Moving ElectrodesScience, 1918
- The Plumages and Moults of the Indigo Bunting ( Passerina cyanea )Science, 1900