Electron and Hole Traps in AgBr
- 1 September 1973
- journal article
- research article
- Published by Taylor & Francis in The Journal of Photographic Science
- Vol. 21 (5) , 202-210
- https://doi.org/10.1080/00223638.1973.11737735
Abstract
Cross sections, concentrations, and depths of various electron and hole traps in AgBr are described. Effects of the traps on measurements of electron and hole lifetimes and mobilities are noted. Microcrystals have electronic behaviour that is very different from that of bulk material owing to the dominant effects of surface traps. Some differences are noted in trapping characteristics at centres of reduction sensitization and of latent image formation.Keywords
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